P.S. Hoffmann, O. Baake, S. Flege, H.M. Ortner,
W. Berky, A. Balogh, B. Beckhoff, M. Kolbe, J. Weser, G.
Ulm, M. Haschke, M. Heck
(Germany)
Chemical and physical characterization of layered
samples
14_02
A.A. Pupyshev
(Russia)
Acting mechanism of inorganic chemicals modifiers in
electrothermal atomic absorption spectrometry
14_03
A.G. Revenko
(Russia)
Modern state and prospects of the development of X-ray
fluorescence analysis in Russia
Lectures
(1540-1720)
14_04
V.A. Trunova, N.V. Brenner, V.V. Zvereva
(Russia)
Examination of the chemical elements ratios in human
nails (SRXRF)
14_05
Zacharia A.N., Chebotaryov A.N.
(Ukraine)
Direct atomic absorption analysis of silica based
materials and some of its peculiarities
14_06
S.K. Savelyev
(Russia)
Simulation of XRF methods and processes by means of
X-Energo tool-kit
14_07
A. Tsyganenko
(Russia)
Variable temperature FTIR spectroscopy in the studies of
surface phenomena
14_08
V.V. Levenets
(Ukraine)
About combined use several methods of the analysis on
ion of beam
