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Program 14 Sept. 2005
Program 15 Sept. 2005
Program 16 Sept. 2005

 

 

ARGUS-9

14 September 2005

Keynote lectures (1400-1530)

14_01

P.S. Hoffmann, O. Baake, S. Flege, H.M. Ortner, W. Berky, A. Balogh, B. Beckhoff, M. Kolbe, J. Weser, G. Ulm, M. Haschke, M. Heck (Germany)
Chemical and physical characterization of layered samples

14_02

A.A. Pupyshev (Russia)
Acting mechanism of inorganic chemicals modifiers in electrothermal atomic absorption spectrometry

14_03

A.G. Revenko (Russia)
Modern state and prospects of the development of X-ray fluorescence analysis in Russia

Lectures (1540-1720)

14_04

V.A. Trunova, N.V. Brenner, V.V. Zvereva (Russia)
Examination of the chemical elements ratios in human nails (SRXRF)

14_05

Zacharia A.N., Chebotaryov A.N. (Ukraine)
Direct atomic absorption analysis of silica based materials and some of its peculiarities

14_06

S.K. Savelyev (Russia)
Simulation of XRF methods and processes by means of X-Energo tool-kit

14_07

A. Tsyganenko (Russia)
Variable temperature FTIR spectroscopy in the studies of surface phenomena

14_08

V.V. Levenets (Ukraine)
About combined use several methods of the analysis on ion of beam



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 updated 07-ago-14